@article{chen02jstvr,
author = {Wei Chen and Roland H. Untch and Gregg Rothermel and Sebastian Elbaum and Jeffery von Ronne},
title = {Can Fault-Exposure-Potential Estimates Improve the Fault Detection Abilities of Test Suites?},
journal = {Journal of Software Testing, Verification, and Reliability},
year = {2002},
volume = {4},
number = {2},
pages = {197-218}
}